MSc C.K. Yang

PhD student
Electronic Instrumentation (EI), Department of Microelectronics

PhD thesis (May 2012): From MEMS to NEMS: Scaling Cantilever Sensors
Promotor: Paddy French

Publications

  1. A Crystal-Less Clock Generation Technique for Battery-Free Wireless Systems
    Chang, Z.; Zhang, Y.; Yang, C.; Luo, Y.; Du, S.; Chen, Y.; Zhao, B.;
    IEEE Transactions on Circuits and Systems I: Regular Papers,
    pp. 1-12, 2022. DOI: 10.1109/TCSI.2022.3201196

  2. A Precision Capacitance-to-Digital Converter with 16.7-bit ENOB and 7.5 ppm/°C Thermal Drift
    R. Yang; M. A. P. Pertijs; S. Nihtianov;
    IEEE Journal of Solid-State Circuits,
    Volume 52, Issue 11, pp. 3018-3031, November 2017. DOI: 10.1109/jssc.2017.2734900
    Abstract: ... This paper presents a high-precision capacitance-to-digital converter (CDC) for displacement measurement in advanced industrial applications, based on a charge-balancing third-order delta–sigma modulator. To achieve high precision, this CDC employs a precision external resistive reference and a quartz-oscillator-based time reference instead of a reference capacitor. To minimize the error contribution of the CDC circuitry, various precision circuit techniques, such as chopping and auto-zeroing, are applied at both system and circuit level. Measurement results of the prototype realized in 0.35-μm CMOS technology show that the CDC achieves an rms resolution of 42 aF across a capacitance range from 6 to 22 pF, corresponding to an effective number of bits (ENOB) of 16.7 bit. The conversion time for one measurement is 10.5 ms, during which the CDC consumes 230 μA from a 3.3-V single supply. The measured thermal stability is within ±7.5 ppm/°C across a temperature range from 20 °C to 70 °C, which represents a significant improvement compared to the state of the art. After a two-point calibration, all ten measured samples from one batch show absolute accuracy below ±25 fF across the entire capacitance measurement range.

  3. Error analysis of a charge-balancing capacitive sensor interface with resistive reference
    R. Yang; S. Nihtianov;
    In O Kaynak (Ed.), Proc. of the 23rd IEEE International Symposium on Industrial Electronics,
    IEEE, pp. 274-280, 2014. Harvest.

  4. Noise analysis and characterization of a charge-balancing-based capacitive sensor interface with a resistive reference
    R. Yang; S. Nihtianov;
    In JC Miguez; D Slomovitz (Ed.), Proc. of the IEEE International Instrumentation and Measurement Technology Conference,
    IEEE, pp. 1182-1186, 2014. Harvest.

  5. Capacitive sensor interface with precision references
    R. Yang; M. A. P. Pertijs; S. Nihtianov; P. Haak;
    In Proc. IEEE International Conference on Industrial Technology (ICIT),
    IEEE, pp. 358‒390, March 2014. DOI: 10.1109/icit.2014.6894896

  6. A time/resistor-referenced capacitive sensor interface for displacement measurement in the sub-nanometer range
    R. Yang; S. Nihtianov;
    In RC Luo (Ed.), Proc. of the 22nd IEEE International Symposium on Industrial Electronics,
    IEEE, pp. 1-5, 2013. Harvest.

  7. Autonomous self-aligning and self-calibrating capacitive sensor system
    O.S. van de Ven; D. Yang; S. Xia; J.P. van Schieveen; J.W. Spronck; R.H. Munnig Schmidt; S. Nihtianov;
    In M Kamel; F Karray; H Hagras (Ed.), Proc. of the 3rd International Conference on Autonomous and Intelligent Systems,
    Springer Verlag, pp. 10-17, 2012.

  8. From MEMS to NEMS: Scaling Cantilever Sensors
    C.K. Yang;
    PhD thesis, Delft University of Technology, 2012.

  9. Performance optimization of self-alignment system for capacitive sensors
    J. van Schieveen; R. Yang; S. Nihtianov; J. Spronck;
    In S Bogosyan; K Ohnishi (Ed.), Proc. of the IEEE International Conference on Mechatronics,
    IEEE, pp. 648-653, 2011.

  10. High-performance eddy current sensor interface for small displacement measurement
    M.R. Nabavi; R. Yang; S. Nihtianov;
    In {Dyer et al.}, C (Ed.), Proc. of the International Instrumentation and Measurement Technology Conference,
    IEEE, pp. 58-62, 2011.

  11. Highly stable capacitance-to-digital converter with improved dynamic range
    R. Nojdelov; R. Yang; X. Guo; S. Nihtianov;
    In S Mukhopadhyay; A Fuchs; KP Jayasundera (Ed.), Proc. of the IEEE Fifth International Conference on Sensing Technology,
    IEEE, pp. 140-144, 2011.

  12. Qualification of a stable capacitive sensor interface, based on capacitance-resistance comparison
    R. Yang; A. Fekri; R. Nojdelov; S. Nihtianov;
    In E Lewis; T Kenny (Ed.), Proc. of the IEEE Sensors conference,
    IEEE, pp. 1181-1184, 2011.

  13. Demonstration of PECVD SiC-SiO2-SiC horizontal slot waveguides
    G. Pandraud; A.B. Neira; E. Margallo Balbas; C.K. Yang; P.M. Sarro;
    IEEE Photonics Technology Letters,
    Volume 22, Issue 6, pp. 398-400, 2010.

  14. Optimized low-power thermal stepper system for harsh and inaccessible environments
    R. Yang; J.P. van Schieveen; S. Nihtianov; J.W. Spronck;
    In s.n. (Ed.), Proceedings IECON 2010,
    IEEE, pp. 1779-1784, 2010.

  15. Electronic system for control of a thermally actuated alignment device
    R. Yang; J.P. van Schieveen; S. Nihtianov; J.W. Spronck;
    In {Rodríguez et al}, J (Ed.), Proceedings ICIT 2010,
    IEEE, pp. 1581-1586, 2010.

  16. Method for determining a spring constant for a deformable scanning probe microscope element, and scanning probe microscope and calibration device arranged for determing a spring constant for a probe element
    H. Sadeghian Marnani; C. Yang; F. van Keulen; J.F.L. Goosen; A. Bossche;
    2010.

  17. Method for measuring a temperature, electromechanical device for measuring a temperature
    H. Sadeghian Marnani; F. van Keulen; C.K. Yang; J.F.L. Goosen; A. Bossche;
    2009. Op naam van TU Delft; 2003431; Op naam van TU Delft.

  18. Electronic control of a thermal actuator for a fully autonomous self-alignment and self-caliration functionality
    C.K. Yang;
    PhD thesis, Delft University of Technology, 2009.

  19. Tribler: a social-based peer-to-peer system
    J.A. Pouwelse; P.J. Garbacki; J. Wang; A. Bakker; J. Yang; A. Iosup; D.H.J. Epema; M.J.T. Reinders; {van Steen}, MR; HJ Sips;
    Concurrency and Computation: Practice & Experience,
    Volume 20, Issue 2, pp. 127-138, 2008.

  20. Thin-film encapsulation of a silicon field emission electron source
    F. Santagata; C.K. Yang; J.F. Creemer; P.M. Sarro;
    In s.n. (Ed.), Proceedings Eurosensors XXII,
    Eurosensors XXII, pp. 625-628, 2008.

  21. Processing of inertial sensors using SF6-O2 Cryogenic plasma process
    G. Craciun; H. Yang; L. Pakula; M.A. Blauw;
    In s.n. (Ed.), SAFE 2003 Semiconductor advances for future electronics,
    Stichting voor de Technische Wetenschappen, pp. 683-686, 2003. CD-ROM.

  22. Remote sensing and petroleum leakage: a review and case study
    F.D. van der Meer; P. Dijk; H. van der Werff; H. Yang;
    Terra Nova: the European journal of geosciences,
    Volume 24, Issue 1, pp. 1-17, 2002.

  23. Imaging spectrometry and petroleum geology
    F.D. van der Meer; H. Yang; S.B. Kroonenberg; H. Lang; P. Dijk; K.H. Scholte; H. van der Werff;
    F.D. van der Meer; {de Jong}, S (Ed.);
    Kluwer Academic Publishers, , pp. 219-232, 2002. Nog niet eerder opgevoerd.

  24. Modified Reynolds' equation for squeeze-film air damping of hole-plates
    M. Bao; H. Yang; Y. Sun;
    In Eurosensors 2002,
    Czech Technical University, pp. 43-44, 2002.

  25. Imaging spectrometry and petroleum geology
    F.D. van der Meer; H. Yang; S.B. Kroonenberg; H. Lang; P. Dijk; K.H. Scholte; H. van der Werff;
    {van der Meer}, F; {de Jong}, S (Ed.);
    Kluwer Academic Publishers, , pp. 219-238, 2000.

  26. Final Technical Report of project BE-1167 MULTISTRESS (period 1-1-96 to 31-12-98) Improving multilayered metallic materials by controlling stress, strain and interface quality and new equipment for determing these characteristics.
    O. Thomas; B. Chenevier; E.J. Mittemeijer; J.E. Sundgren; D. de Boer; A. Charaï; L. Roux; P. Gergaud; A Böttger; H. Yang; F Torregrossa; A Leenaers; P Sandstrom;
    TU Delft, , 1999.

BibTeX support

Last updated: 15 Jun 2019

Chung-Kai Yang

Alumnus
  • Left in 2012