dr. Jing Li

Guest
Electronic Instrumentation (EI), Department of Microelectronics

Themes: Smart Ultrasound

Biography

Jing Li was born in Sichuan, China. He received the B.Sc. degree and PhD in microelectronics from the University of Electronic Science and Technology of China in 2009 and 2014, respectively. For his doctoral dissertation, he worked on wide-band high-speed ADCs. From January 2015, he has been a lecturer at the University of Electronic Science and Technology of China, where his research interest focuses on low-power and high-speed data conversion.

Since September 2017, he has been a guest researcher at the Electronic Instrumentation Laboratory of Delft University of Technology, where he works on ASIC design for medical ultrasound.

Last updated: 27 Dec 2018

Jing Li

Alumnus
  • Left in 2018