MSc Kashmiri

1. Electrothermal Frequency References in Standard CMOS
   S.M. Kashmiri; K.A.A. Makinwa;
   Springer Verlag, in Analog Circuits and Sinal Processing, 2013.

2. A scaled thermal-diffusivity-based 16 MHz frequency reference in 0.16 μm CMOS
   S.M. Kashmiri; K. Souri; K.A.A. Makinwa;
   IEEE Journal of Solid State Circuits,
   Volume 47, Issue 7, pp. 1535-1545, July 2012. Harvest Article number: 6216450.

3. Thermal-diffusivity-based frequency references in standard CMOS
   S.M. Kashmiri;
   PhD thesis, Delft University of Technology, 2012.

4. A scaled thermal-diffusivity-based frequency reference in 0.16 um CMOS
   S.M. Kashmiri; K. Souri; K.A.A. Makinwa;
   In H Tenhunen; M Aberg (Ed.), 37th European Soldi-State Circuits Conference 2011, (ESSCIRC),
   IEEE, pp. 503-506, 2011.

5. A Thermal-Diffusivity-Based Frequency Reference in Standard CMOS With an Absolute Inaccuracy of ±0.1\% From -55°C to 125°C
   S. M. Kashmiri; M. A. P. Pertijs; K. A. A. Makinwa;
   IEEE Journal of Solid-State Circuits,
   Volume 45, Issue 12, pp. 2510‒2520, December 2010. DOI: 10.1109/JSSC.2010.2076343
   
   Abstract: ...

   An on-chip frequency reference exploiting the well-defined thermal-diffusivity (TD) of IC-grade silicon has been realized in a standard 0.7 μm CMOS process. A frequency-locked loop (FLL) locks the frequency of a digitally controlled oscillator (DCO) to the process-insensitive phase shift of an electrothermal filter (ETF). The ETF's phase shift is determined by its geometry and by the thermal diffusivity of bulk silicon (D). The temperature dependence of is compensated for with the help of die-temperature information obtained by an on-chip band-gap temperature sensor. The resulting TD frequency reference has a nominal output frequency of 1.6 MHz and dissipates 7.8 mW from a 5 V supply. Measurements on 16 devices show that it has an absolute inaccuracy of ±0.1\% (σ = ±0.05\%) over the military temperature range (-55°C to 125°C ), with a worst case temperature coefficient of ± 11.2 ppm/°C.

6. A CMOS temperature sensor with an energy-efficient zoom ADC and an inaccuracy of ±0.25°C (3¿) from -40°C to 125°C
   K. Souri; S.M. Kashmiri; K.A.A. Makinwa;
   In 2010 IEEE International solid-state circuits conference; Digest of technical papers (ISSCC) 2010,
   IEEE, pp. 310-311, 2010.

7. A Thermal-diffusivity-based Frequency Reference in Standard CMOS with an Absolute Inaccuracy of ±0.1\% from -55°C to 125°C
   M. Kashmiri; M. Pertijs; K. Makinwa;
   In Dig. Techn. Papers IEEE International Solid-State Circuits Conference (ISSCC),
   IEEE, pp. 74‒75, February 2010. DOI: 10.1109/ISSCC.2010.5434042
   
   Abstract: ...

   Most electronic systems require a frequency reference, and so, much research has been devoted to the realization of on-chip frequency references in standard CMOS. However, the accuracy of such references is limited by the process spread and temperature drift of on-chip components. By means of trimming and temperature compensation, RC and ring oscillators have achieved inaccuracies in the order of 1\%. LC oscillators achieve inaccuracies below 0.1\%, but dissipate much more power. This paper describes a new approach, which exploits the well-defined thermal diffusivity of IC-grade silicon in order to generate frequencies stable to 0.1\% over process and temperature variations. Such thermal diffusivity (TD) frequency references dissipate less power than LC oscillators, are more accurate than RC and ring oscillators and, uniquely, scale well with process.

8. A temperature-to-digital converter based on an optimized electrothermal filter
   S.M. Kashmiri; S. Xia; K.A.A. Makinwa;
   IEEE Journal of Solid State Circuits,
   Volume 44, Issue 7, pp. 2026-2035, 2009.

9. CMOS temperature sensors based on thermal diffusion
   C.P.L. van Vroonhoven; S.M. Kashmiri; K.A.A. Makinwa;
   s.n. (Ed.);
   Sense of Contact 2009, , pp. 1-4, 2009.

10. CMOS temperature sensors based on thermal diffusion
    C.P.L. van Vroonhoven; S.M. Kashmiri; K.A.A. Makinwa;
    In s.n. (Ed.), Proceedings of the international workshop on thermal investigations of ICs and systems,
    Therminic 2009, pp. 140-143, 2009.

11. Measuring the thermal diffusivity of CMOS chips
    S.M. Kashmiri; K.A.A. Makinwa;
    In s.n. (Ed.), Proceedings of IEEE Sensors 2009,
    IEEE, pp. 45-48, 2009.

12. A multi-bit cascade sigma-delta modulator with an oversampled single-bit DAC
    S.M. Kashmiri; K.A.A. Makinwa; L.J. Breems;
    In s.n. (Ed.), Proceedings of ICECS 2009,
    ICECS, pp. 49-52, 2009.

13. A multi bit cascaded sigma delta modulator with an oversampled single bit DAC
    S.M. Kashmiri; K.A.A. Makinwa; L.J. Breems;
    In s.n. (Ed.), Proceedings of International Conference on Electronics Circuits and Systems,
    ICECS, pp. 49-52, 2009.

14. A digitally assisted electrothermal frequency locked loop
    S.M. Kashmiri; K.A.A. Makinwa;
    In D Tsoukalas; Y Papananos (Ed.), Proceedings of ESSCIRC 2009,
    ESSCIRC, pp. 296-299, 2009.

15. A temperature to digital converter based on an optimized electrothermal filter
    S.M. Kashmiri; S. Xia; K.A.A. Makinwa;
    In W Redman-White; A Walton (Ed.), Proceedings of the 34th European Solid-State Circuits Conference, 2008. ESSCIRC 2008,
    IEEE, pp. 74-77, 2008.

16. High-performance analog delays: Surpassing Bessel-Thomson by Pade-approximated Gaussians
    S.M. Kashmiri; S.A.P. Haddad; W.A. Serdijn;
    In s.n. (Ed.), Circuits and Systems, 2006. ISCAS 2006. IEEE International symposium on,
    IEEE, pp. 2349-2353, 2006.

17. "Over-sampled single-bit DAC in a wide band, cascaded continuous-time sigma-delta ADC (U-SP-2-I-ICT)
    S.M. Kashmiri;
    PhD thesis, Delft University of Technology, 2006.

18. Systematic performance comparision of Bessel Thomson vs Pade approximated delay filters (U-SP-2-I-ICT)
    S.M. Kashmiri; S.A.P. Haddad; W.A. Serdijn;
    In s.n. (Ed.), Systematic performance comparision of Bessel Thomson vs Pade approximated delay filters,
    ProRISC, pp. 1-5, 2005.

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