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Shuang Xie


Research interests


Integrated Temperature Sensors, CMOS Image Sensors, Power/Thermal Management

Biography


Shuang Xie was born in Shenyang, China in 1984. She received her PhD Degree in Electrical Engineering from University of Toronto, Canada in 2014. Her PhD research work was on implementing low power self-calibrated temperature sensors for VLSI thermal management systems.
Since June 2015, she has been a postdoctoral researcher at Electronic Instrumentation Laboratory of Delft University of Technology. Her current research projects involve integrated temperature sensors and CMOS image sensors.

Contact


Electronic Instrumentation Laboratory
Delft University of Technology
Faculty of Electrical Engineering, Mathematics and Computer Science
Department of Micro-electronics and Computer Engineering
Mekelweg 4
2628 CD Delft
The Netherlands

Room: HB 15.110

Phone: +31 (0)15 27 83575

Fax: +31 (0)15 27 85755

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